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International Conference on Computer Science, Engineering and Education Applications

ICCSEEA 2019: Advances in Computer Science for Engineering and Education II pp 316–324Cite as

Probability Models for Validity Evaluation

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Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 938))

Abstract

Testing is widely used for detection of malfunctions in digital systems. However besides malfunctions in digital systems, there is a possibility of faults that cannot be defected by testing tools. As a result of faults, a digital system may not go to a wrong state. A false command may cause the object of control to go to the wrong state, which is confirmed by practical cases. Modern elements of digital systems are created by using a nanometer range of design limits and they operate at a high clock frequency. High energy particles (SEE – Single Event Effects) affect the operation of microcircuits that results in an increase in probability of faults. This fact necessitates a more critical evaluation of a quality of computer device designs according to reliability of their functioning. This article represents further development of methods for optimization of signal probability model with the aim to decrease the volume of calculations. The obtained results can be used at the stage of computer systems design for the preliminary evaluation of reliability of their functioning under fault conditions.

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References

  1. Avizienis, A., Laprie, J.C., Randell, B., Landwehr, C.: Basic concepts and taxonomy of dependable and secure computing. IEEE Trans. Dependable Secur. Comput. 1(1), 11–33 (2004)

    Article  Google Scholar 

  2. Kharchenko, V.S.: Dependability and dependable systems: elements of methodology. Radioelectron. Comput. Syst. 5(17), 7–19 (2006)

    Google Scholar 

  3. Bilal, B., Ahmed, S., Kakkar, V.: An insight into beyond CMOS next generation computing using quantum-dot cellular automata nanotechnology. Int. J. Eng. Manuf. (IJEM) 8(1), 25–37 (2018). https://doi.org/10.5815/ijem.2018.01.03

    Article  Google Scholar 

  4. Wang, L., Wang, G.: Big data in cyber-physical systems, digital manufacturing and industry 4.0. Int. J. Eng. Manuf. (IJEM) 6(4), 1–8 (2016). https://doi.org/10.5815/ijem.2016.04.01

    Article  Google Scholar 

  5. Normand, E.: Single event upset at ground level. IEEE Trans. Nuclear Sci. 43, 2742–2750 (1996). http://web.archive.org/web/20131021190327/http:/pdf.yuri.se/files/art/2.pdf

  6. Rani, A.: Grover, N,: Design and implementation of control Unit-ALU of 32 bit asynchronous microprocessor based on FPGA. Int. J. Eng. Manuf. (IJEM) 8(3), 12–22 (2018). https://doi.org/10.5815/ijem.2018.03.02

    Article  Google Scholar 

  7. Rani, A., Grover, N.: Novel design of 32-bit asynchronous (RISC) microprocessor & its implementation on FPGA. Int. J. Inf. Eng. Electron. Bus. (IJIEEB) 10(1), 39–47 (2018). https://doi.org/10.5815/ijieeb.2018.01.06

    Article  Google Scholar 

  8. Klyatchenko, Y., Tarasenko, G., Tarasenko-Klyatchenko, O., Tarasenko, V., Teslenko, O.: Optimization of processor devices based on the maximum indicators of self-correction. In: Advances in Computer Science for Engineering and Education, vol. 754, pp. 380–390. Springer (2018)

    Google Scholar 

  9. Wang, X., Li, S., Liu, F., Fan, X.: Reliability analysis of combat architecture model based on complex network. Int. J. Eng. Manuf. (IJEM) 2(2), 15–22 (2012). https://doi.org/10.5815/ijem.2012.02.03

    Article  Google Scholar 

  10. KalaiKaviya, K., Balasubramanian, D.P., Tamilselvan, S.: Design of a optimized parallel array multiplier using parallel prefix adder. Int. J. Eng. Manuf. (IJEM) 3(2), 40–50 (2013). https://doi.org/10.5815/ijem.2013.02.03

    Article  Google Scholar 

  11. Rajaei, R.: Design of a radiation hardened register file for highly reliable microprocessors. International Int. J. Eng. Manuf. (IJEM) 6(5), 11–21 (2016). https://doi.org/10.5815/ijem.2016.05.02

    Article  Google Scholar 

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Author information

Authors and Affiliations

  1. National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kiev, Ukraine

    Drobiazko Iryna, Sapsai Tetiana, Tarasenko Volodymyr & Teslenko Olexandr

Authors
  1. Drobiazko Iryna
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  2. Sapsai Tetiana
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  3. Tarasenko Volodymyr
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  4. Teslenko Olexandr
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Corresponding author

Correspondence to Sapsai Tetiana .

Editor information

Editors and Affiliations

  1. School of Educational Information Technology, Central China Normal University, Wuhan, Hubei, China

    Zhengbing Hu

  2. Mechanical Engineering Research Institute of the Russian Academy of Sciences, Moscow, Russia

    Sergey Petoukhov

  3. “Igor Sikorsky Kiev Polytechnic Institute”, National Technical University of Ukraine, Kiev, Ukraine

    Ivan Dychka

  4. Halmos College of Natural Sciences and Oceanography, Nova Southeastern University, Ft. Lauderdale, FL, USA

    Matthew He

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Iryna, D., Tetiana, S., Volodymyr, T., Olexandr, T. (2020). Probability Models for Validity Evaluation. In: Hu, Z., Petoukhov, S., Dychka, I., He, M. (eds) Advances in Computer Science for Engineering and Education II. ICCSEEA 2019. Advances in Intelligent Systems and Computing, vol 938. Springer, Cham. https://doi.org/10.1007/978-3-030-16621-2_29

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