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Improving Quality Control of Mechatronic Systems Using KPI-Based Statistical Process Control

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Advances in Manufacturing, Production Management and Process Control (AHFE 2018)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 793))

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Abstract

Statistical Process Control (SPC) is a quality control instrument for the manufacturing of mechatronic systems that enables to detect minor deviations within the manufactured products to prevent serious quality issues and financial loss. A significant hindrance for applying SPC is that current literature does not provide a process that supports the selection of data that shall be monitored, the gathering, and analysis of the data, and the visualization of the results all in one. In this paper, we provide a process that contains all relevant steps to establish a fully automatic SPC. Our SPC concept is based on Key Performance Indicators (KPIs) for mechatronic systems that statistically measure the product’s core functionalities based on its sensor data during product control. By reusing these KPIs, we obtain an efficient process for applying a lightweight SPC. We implement and evaluate our concepts at Diebold Nixdorf (DN) – a leading manufacturer of ATMs.

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Author information

Authors and Affiliations

  1. Fraunhofer IEM, Zukunftsmeile 1, 33102, Paderborn, NRW, Germany

    Benedict Wohlers, Stefan Dziwok & David Schmelter

  2. Diebold Nixdorf Systems GmbH, Heinz-Nixdorf-Ring 1, 33106, Paderborn, NRW, Germany

    Wadim Lorenz

Authors
  1. Benedict Wohlers
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  2. Stefan Dziwok
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  3. David Schmelter
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  4. Wadim Lorenz
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Corresponding author

Correspondence to Benedict Wohlers .

Editor information

Editors and Affiliations

  1. University of Central Florida, Orlando, FL, USA

    Waldemar Karwowski

  2. Poznan University of Technology, Poznan, Poland

    Stefan Trzcielinski

  3. Poznan University of Technology, Poznan, Poland

    Beata Mrugalska

  4. Architectural Department, University of Chieti-Pescara, Pescara, Italy

    Massimo Di Nicolantonio

  5. Architectural Department, University of Chieti-Pescara, Ortona, Italy

    Emilio Rossi

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Wohlers, B., Dziwok, S., Schmelter, D., Lorenz, W. (2019). Improving Quality Control of Mechatronic Systems Using KPI-Based Statistical Process Control. In: Karwowski, W., Trzcielinski, S., Mrugalska, B., Di Nicolantonio, M., Rossi, E. (eds) Advances in Manufacturing, Production Management and Process Control. AHFE 2018. Advances in Intelligent Systems and Computing, vol 793. Springer, Cham. https://doi.org/10.1007/978-3-319-94196-7_37

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  • DOI: https://doi.org/10.1007/978-3-319-94196-7_37

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-94195-0

  • Online ISBN: 978-3-319-94196-7

  • eBook Packages: EngineeringEngineering (R0)

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