Volume 37, Issue 2 | Analog Integrated Circuits and Signal Processing

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Volume 37, Issue 2

November 2003

Special Issue on Electronic Design for Quality

6 articles in this issue

Guest Editorial: Electronic Design for Quality
Tuna B. Tarim
Editorial Board Pages: 71 - 71
Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips
A. Rodríguez-Vázquez
G. Liñán
R. Domínguez-Castro
OriginalPaper Pages: 73 - 83
An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations
Massimo Conti
Paolo Crippa
Silvia Lucherini
OriginalPaper Pages: 85 - 102
A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells
Rafael López-Ahumada
Rafael Rodríguez-Macías
OriginalPaper Pages: 103 - 111
Regression Criteria and Their Application in Different Modeling Cases
Georges Gielen
Willy Sansen
Erik Lauwers
OriginalPaper Pages: 113 - 122
Area Allocation Strategies for Enhancing Yield of R-2R Ladders
Yu Lin
Randall Geiger
OriginalPaper Pages: 123 - 132