The tensile deformation behaviour of a transparent ABS polymer R. W. TrussG. A. Chadwick Papers Pages: 1385 - 1392
Crystal growth of chemical Co-P and electrodeposited Co on Ni and Cu single crystals P. CavallottiS. NoerG. Caironi Papers Pages: 1419 - 1429
Thermal-stress resistance and fracture toughness of two tool ceramics Y. W. Mai Papers Pages: 1430 - 1438
Application of high resolution autoradiography to study the microsegregation of carbon in thin foil microstructures of a 12% Cr steel using 14C as a radioactive tracer G. V. Prabhu GaunkarA. M. HuntzP. Lacombe Papers Pages: 1439 - 1449
Eutectic solidification of the pseudo binary system of polyethylene and 1, 2, 4, 5-tetrachlorobenzene P. SmithA. J. Pennings Papers Pages: 1450 - 1458
Phase relations of cordierite and sapphirine in the system MgO-Al2O3-SiO2 R. M. SmartF. P. Glasser Papers Pages: 1459 - 1464
An apparatus for the study of strain recovery in compacts E. D. BailyP. York Papers Pages: 1470 - 1474
Effect of molecular weight on the fracture surface energy of poly(methyl methacrylate) in cleavage R. P. KusyM. J. Katz Papers Pages: 1475 - 1486
Geometric surface relief and the allotropic transformation in iron K. R. KinsmanR. H. RichmanJ. D. Verhoeven Papers Pages: 1487 - 1493
Electrical conductivity in hot-pressed nitrogen ceramics J. S. ThorpR. I. Sharif Papers Pages: 1494 - 1500
Surface hardening of ruby and sapphire Takesh NagaiKiyotaka WasaShigeru Hayakawa Papers Pages: 1509 - 1512
Surface microcracking induced by weathering of polycarbonate sheet A. BlagaR. S. Yamasaki Papers Pages: 1513 - 1520
Steady-state creep of single-phase crystalline matter at high temperature S. TakeuchiA. S. Argon Review Pages: 1542 - 1566
The effect of triple junctions on grainboundary migration K. K. ShihJ. C. M. Li Letters Pages: 1571 - 1574
Factors determining the electric strength of polymeric dielectrics H. SabuniJ. K. Nelson Letters Pages: 1574 - 1576
X-irradiation and the annealing behaviour of polyethylene A. D. V. WatersA. H. Windle Letters Pages: 1577 - 1578
A new method of film casting for electron microscopy A. BeamishD. J. Hourston Letters Pages: 1581 - 1582